Electrical Engineering and Computer Science - Computer Science and Engineering

Fingerprint The fingerprint is based on mining the text of the scientific documents related to the associated persons. Based on that an index of weighted terms is created, which defines the key subjects of research unit

Costs Engineering & Materials Science
Communication Engineering & Materials Science
Hardware Engineering & Materials Science
Experiments Engineering & Materials Science
Servers Engineering & Materials Science
Scheduling Engineering & Materials Science
Sensors Engineering & Materials Science
Internet Engineering & Materials Science

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Grants 1984 2025

Research Output 1973 2017

1 Citations

14.7 A 288μW programmable deep-learning processor with 270KB on-chip weight storage using non-uniform memory hierarchy for mobile intelligence

Bang, S., Wang, J., Li, Z., Gao, C., Kim, Y., Dong, Q., Chen, Y. P., Fick, L., Sun, X., Dreslinski, R., Mudge, T., Kim, H. S., Blaauw, D. & Sylvester, D. Mar 2 2017 2017 IEEE International Solid-State Circuits Conference, ISSCC 2017. Institute of Electrical and Electronics Engineers Inc., Vol. 60, p. 250-251 2 p. 7870355

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Galaxies
Adrenal Gland Neoplasms
Achondroplasia
Fusobacterium
Community Psychiatry

3.7 A 1920×1080 30fps 2.3TOPS/W stereo-depth processor for robust autonomous navigation

Li, Z., Dong, Q., Saligane, M., Kempke, B., Yang, S., Zhang, Z., Dreslinski, R., Sylvester, D., Blaauw, D. & Kim, H. S. Mar 2 2017 2017 IEEE International Solid-State Circuits Conference, ISSCC 2017. Institute of Electrical and Electronics Engineers Inc., Vol. 60, p. 62-63 2 p. 7870261

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Galaxies
Regional Anatomy
Community Psychiatry
Airway Obstruction
Analgesia

3DFAR: A three-dimensional fabric for reliable multi-core processors

Bagherzadeh, J. & Bertacco, V. May 11 2017 Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017. Institute of Electrical and Electronics Engineers Inc., p. 310-313 4 p. 7927006

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Core levels
Redundancy
Transistors
Pipelines
Switches

Activities 2010 2012

  • 2 Editorial activity